Growth of ZnO on Sapphire (0001) by the Vapor Phase Epitaxy Using a Chloride Source

Abstract
Zinc oxide (ZnO) films were deposited on sapphire (0001) substrates by vapor phase epitaxy using ZnCl2 as a chloride source. The X-ray diffractogram showed a typical pattern of epitaxially grown ZnO with a hexagonal structure, and a full width at half-maximum (FWHM) of 23.3 min was obtained in the X-ray diffraction profile. Growth rate of the ZnO film increased with increasing growth temperature, the growth rate varied from 0.5 to 3.0 µm/h. A strong band edge emission at 370.0 nm was observed at 20 K photoluminescence spectra.