X-ray and electron microscopy studies of single-layer TaS2 and NbS2
- 1 March 1984
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 113 (2) , 165-172
- https://doi.org/10.1016/0040-6090(84)90025-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The attainment of a substrate temperature of 25K in a Philips FM 300 electron microscopeJournal of Physics E: Scientific Instruments, 1982
- Localization in the metallic regime of granular Cu—SiO2 filmsSolid State Communications, 1982
- New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall ResistancePhysical Review Letters, 1980
- The phase transition in 2H-TaS2at 75 KPhilosophical Magazine, 1974
- X-Ray Diffraction in Random Layer LatticesPhysical Review B, 1941