Simultaneous switching noise measurement on a CMOS chip on an MLC SCM
- 17 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Power distribution modelling of high performance first level computer packagesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Simultaneous switching ground noise calculation for packaged CMOS devicesIEEE Journal of Solid-State Circuits, 1991