Role of interface roughness scattering in self-consistent resonant-tunneling-diode simulations
- 15 September 1998
- journal article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 58 (11) , 7279-7285
- https://doi.org/10.1103/physrevb.58.7279
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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