The application of secondary ion emission to impurity control in tokamaks
- 2 December 1979
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 85-86, 1179-1183
- https://doi.org/10.1016/0022-3115(79)90421-5
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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