Can IDDQ test replace conventional stuck-fault test?
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Stuck-open and transition fault testing in CMOS complex gatesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Defect analysis and test generation for gate oxide shorts in CMOS ICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Test Generation for MOS Circuits Using D-AlgorithmPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983