RADFET: A review of the use of metal-oxide-silicon devices as integrating dosimeters
- 1 January 1986
- journal article
- review article
- Published by Elsevier in International Journal of Radiation Applications and Instrumentation. Part C. Radiation Physics and Chemistry
- Vol. 28 (2) , 235-244
- https://doi.org/10.1016/1359-0197(86)90134-7
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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