Reliability Investigations of GaAs Power FETs with Aluminium Gate Metallisation
- 1 October 1978
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Reliability Study of GaAs MESFET'sIEEE Transactions on Microwave Theory and Techniques, 1976
- Some Aspects of GaAs MESFET ReliabilityIEEE Transactions on Microwave Theory and Techniques, 1976
- The Design and Evaluation of GaAs Power MESFETsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1975
- Electromigration testing—A current problemMicroelectronics Reliability, 1974