Atomic Scattering Factors of Zn Determined from Measurement of X-Ray Pendellösung Intensity Beats Using White Radiation

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Abstract
The Pendellösung intensity beats of white radiations diffracted from Zn single crystals grown by a solidification method have been measured by the energy-dispersive diffraction technique using a solid-state detector. The atomic scattering factors of Zn were evaluated by measuring the positions of the intensity extrema and utilizing the dynamical diffraction theory for the eight low-order reflections. The absolute atomic scattering factors were found to be smaller than those calculated for free atoms by the relativistic Hartree-Fock method, especially for low-order reflections, as well as for the reflections from the basal plane. The result suggests that the outer electrons diffuse out, particularly in the direction of the C-axis, from the spherical electron clouds in Zn atoms in the crystals.

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