A New Method for Measuring the X-Ray “Pendellösung” Beats at the Center of the Borrmann Fan Using White Radiations
- 1 May 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (5A) , L304-306
- https://doi.org/10.1143/jjap.22.l304
Abstract
A new technique is proposed to measure the X-ray Pendellösung intensity beats using white radiations and parallel-sided single crystals. The beats are measured at the center of the Borrmann fan on the exit surface of a thick Si specimen. The atomic scattering factors of Si are determined for the 220 reflection with an accuracy remarkably higher than that in the previous method.Keywords
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