TEM/STEM requirements: multipurpose or specialized instruments?
- 1 July 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 131 (1) , 47-53
- https://doi.org/10.1111/j.1365-2818.1983.tb04229.x
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- A method for mapping localized displacement fields in boundariesJournal of Microscopy, 1983
- The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloyJournal of Microscopy, 1983
- The use of moiré techniques to measure rigid body displacementsJournal of Microscopy, 1983
- High-resolution images of bent crystals having rutile-type structures: Tin dioxidePhilosophical Magazine A, 1982
- Combined HREM and STEM microanalysis on decorated dislocation coresUltramicroscopy, 1982
- Crystallographic orientation effects in energy dispersive X-ray analysisPhilosophical Magazine A, 1981
- The structure of shear bands in metallic glassesActa Metallurgica, 1981
- Electron diffraction effects in 2H-TaS2Philosophical Magazine, 1975
- Investigations of dislocation strain fields using weak beamsPhilosophical Magazine, 1969
- Diffraction contrast from spherically symmetrical coherency strainsPhilosophical Magazine, 1963