Electron trapping in buried oxides during irradiation at 40 and 300 K
Open Access
- 1 December 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (6) , 2627-2634
- https://doi.org/10.1109/23.556845
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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