Current and voltage noise in WO3 nanoparticle films
- 15 April 2002
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 91 (8) , 5221-5226
- https://doi.org/10.1063/1.1423398
Abstract
Current and voltage noise measurements have been carried out on nanoparticle films. The fluctuation dissipation theorem holds, which indicates that the observed noise is an equilibrium phenomenon. Results on the thinnest films show that noise measurements can be used for quality assessment of nanocrystalline insulating films.
This publication has 14 references indexed in Scilit:
- Gas‐Sensing Properties of Nanocrystalline WO3 Films Made by Advanced Reactive Gas DepositionJournal of the American Ceramic Society, 2001
- Electrical Properties of Nanocrystalline Tungsten TrioxideMRS Proceedings, 1999
- Lognormal Size Distributions in Particle Growth Processes without CoagulationPhysical Review Letters, 1998
- Grain‐Size Effects in Tungsten Oxide‐Based Sensor for Nitrogen OxidesJournal of the Electrochemical Society, 1994
- Noise as a diagnostic tool for quality and reliability of electronic devicesIEEE Transactions on Electron Devices, 1994
- Materials with ultrafine microstructures: Retrospectives and perspectivesNanostructured Materials, 1992
- Cluster-Assembled Nanophase MaterialsAnnual Review of Materials Science, 1991
- Experimental studies on 1/f noiseReports on Progress in Physics, 1981
- Ultrafine metal particlesJournal of Applied Physics, 1976
- Aluminium spearing in silicon integrated circuitsSolid-State Electronics, 1973