Noise as a diagnostic tool for quality and reliability of electronic devices

This publication has 56 references indexed in Scilit:

• Parameter extraction and 1/f noise in a surface and a bulk-type, p-channel LDD MOSFET
  Solid-State Electronics, 1994
• An explanation of noise in LDD MOSFETs from the ohmic region to saturation
  Solid-State Electronics, 1993
• Low-frequency noise behavior of γ-irradiated partially depleted silicon-on-insulator n-channel metal-oxide-semiconductor transistors
  Applied Physics Letters, 1993
• 1/ƒ noise in MOSFET as a diagnostic tool
  Solid-State Electronics, 1992
• 1/ƒ noise in series resistance of LDD MOSTs
  Solid-State Electronics, 1992
• Noise spectral density measurements of a radiation hardened CMOS process in the weak and moderate inversion
  IEEE Transactions on Nuclear Science, 1992
• Positive Charge in Silicon Dioxide Due to High Electric Field FN Injection
  MRS Proceedings, 1992
• On 1/f trapping noise in MOSTs
  IEEE Transactions on Electron Devices, 1990
• 1/f; noise model for MOSTs biased in nonohmic region
  Solid-State Electronics, 1980
• Model for 1/f; noise in MOS transistors biased in the linear region
  Solid-State Electronics, 1980