Scanning near-field optic/atomic-force microscopy
- 28 February 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 57 (2-3) , 141-146
- https://doi.org/10.1016/0304-3991(94)00125-7
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Superresolution optical imaging with a high-brightness subwavelength light sourceUltramicroscopy, 1992
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- A Photon Scanning Tunneling Microscope Using an AlGaAs LaserJapanese Journal of Applied Physics, 1991
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- A Light Source Smaller Than the Optical WavelengthScience, 1990
- New form of scanning optical microscopyPhysical Review B, 1989
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Microscopy and pattern generation with scanned evanescent wavesApplied Optics, 1984
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982