Numerical modeling of superlattice x-ray-scattering intensities
- 15 May 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 43 (15) , 12296-12303
- https://doi.org/10.1103/physrevb.43.12296
Abstract
We describe a one-dimensional x-ray-scattering model that includes discrete layer-thickness fluctuations and interfacial diffusion in the kinematical approximation. We demonstrate the use of the model in an analysis of the out-of-plane scattering intensities of epitaxial Co-Au and Co-Cu superlattices. In the case of Co-Au superlattices, the experimental data show that interfacial diffusion is limited to a two-monolayer region, and that layer-thickness fluctuations are of order ±1 monolayer. The superlattice features in Co-Cu superlattice measurements are shown to arise from lattice-spacing modulations and are insensitive to composition modulation. The measured intensities are consistent with Co-Cu interfaces which areKeywords
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