Secondary electron emission induced by impact of low-velocity molecular ions on a microchannel plate
- 15 September 1989
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 92, 195-210
- https://doi.org/10.1016/0168-1176(89)83028-9
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Laser desorption ionization of proteins with molecular masses exceeding 10,000 daltonsAnalytical Chemistry, 1988
- 252Cf plasma desorption mass spectrometry using a Mamyrin reflectron in a low voltage regimeInternational Journal of Mass Spectrometry and Ion Processes, 1987
- Total molecular yields for fast heavy ion induced desorption of biomoleculesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- A comparison of secondary electron yields from accelerated water cluster ions (M/z<50 000) striking Al2O3 and copper surfacesJournal of Applied Physics, 1983
- Threshold studies of secondary electron emission induced by macro-ion impact on solid surfacesNuclear Instruments and Methods, 1980
- Thin film deposition by the electrospray method for californium-252 plasma desorption studies of involatile moleculesAnalytical Chemistry, 1979
- Microchannel plate detectorsNuclear Instruments and Methods, 1979
- A model of secondary electron yields from atomic and polyatomic ion impacts on copper and tungsten surfaces based upon stopping-power calculationsJournal of Applied Physics, 1977
- Low noise, high voltage secondary emission ion detector for polyatomic ionsInternational Journal of Mass Spectrometry and Ion Physics, 1977
- Channeltron efficiency for counting of H+ and H− at low energyReview of Scientific Instruments, 1975