Electrical characterization of crystal defects and oxygen in czochralski silicon using a gate-controlled diode
- 30 November 1981
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 24 (11) , 1015-1023
- https://doi.org/10.1016/0038-1101(81)90129-5
Abstract
No abstract availableKeywords
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