Multiple fault detection using single fault test sets
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 7 (1) , 100-108
- https://doi.org/10.1109/43.3137
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Design for Autonomous TestIEEE Transactions on Computers, 1981
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976
- Minimal Fault Tests for Combinational NetworksIEEE Transactions on Computers, 1974
- A New Representation for Faults in Combinational Digital CircuitsIEEE Transactions on Computers, 1972
- Multiple Fault Detection in Combinational NetworksIEEE Transactions on Computers, 1972
- Fault Equivalence in Combinational Logic NetworksIEEE Transactions on Computers, 1971
- Cause-Effect Analysis for Multiple Fault Detection in Combinational NetworksIEEE Transactions on Computers, 1971
- Optimum test patterns for parity networksPublished by Association for Computing Machinery (ACM) ,1970
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966