Quantitative surface analysis of coated materials by SNMS
- 1 January 1990
- journal article
- Published by Springer Nature in Microchimica Acta
- Vol. 101 (1-6) , 101-108
- https://doi.org/10.1007/bf01244163
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Depth analysis of metal coatings by glow discharge spectrometry with an argon—helium gas mixtureSurface and Interface Analysis, 1989
- Coating technologyAnalytical and Bioanalytical Chemistry, 1989
- Quantification of SNMS investigations of coated materialsAnalytical and Bioanalytical Chemistry, 1989
- The status of reference data, reference materials and reference procedures in surface analysisSurface and Interface Analysis, 1988
- Quantitative determination of chromium in conversion layers on aluminium by use of calibration samplesSurface and Interface Analysis, 1988
- An NBS standard reference material for depth profile analysisSurface and Interface Analysis, 1988
- The development of standards for surface analysisSurface and Interface Analysis, 1988
- Combined electron gas SNMS and SIMS instrument for trace and depth profile analysis with high dynamic rangeAnalytical and Bioanalytical Chemistry, 1987
- Secondary Neutral Mass Spectrometry (SNMS) and Its Application to Depth Profile and Interface AnalysisPublished by Springer Nature ,1984
- Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profilingApplied Physics B Laser and Optics, 1977