Preparation and Characterization of Aluminum-doped SiO2:Sm3+ Phosphor
- 1 May 1989
- journal article
- Published by Oxford University Press (OUP) in Chemistry Letters
- Vol. 18 (5) , 829-832
- https://doi.org/10.1246/cl.1989.829
Abstract
Samarium ions in Al-doped SiO2:Sm3+ phosphor were revealed to be atomically dispersed in small Al2O3 crystallites by forming Sm–O–Al bonding, which contributes to improvements in the fluorescent intensity of SiO2:Sm3+ phosphor.This publication has 9 references indexed in Scilit:
- Aluminum or phosphorus co-doping effects on the fluorescence and structural properties of neodymium-doped silica glassJournal of Applied Physics, 1986
- Catalyst preparation procedure probed by EXAFS spectroscopy. 2. Cobalt on titaniaJournal of the American Chemical Society, 1984
- Preparation of Nd-Doped SiO2Glasses by Axial Injection Plasma Torch CVD and Their Fluorescence PropertiesJapanese Journal of Applied Physics, 1984
- Catalyst preparation procedure probed by EXAFS spectroscopy. 1. Nickel on silicaJournal of the American Chemical Society, 1984
- Laboratory EXAFS spectrometer with a bent crystal, a solid-state detector, and a fast detection systemReview of Scientific Instruments, 1983
- Particle-size distribution of nickel dispersed on silica and its effects on hydrogenation of propionaldehydeJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1983
- Optically pumped Ce:LaF_3 laser at 286 nmOptics Letters, 1980
- Ultraviolet solid-state Ce:YLF laser at 325 nmOptics Letters, 1979
- Neodymium-doped silica lasers in end-pumped fiber geometryApplied Physics Letters, 1973