Growth of high quality GaN layers with AlN buffer on Si(111) substrates
- 1 May 2001
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 225 (2-4) , 150-154
- https://doi.org/10.1016/s0022-0248(01)00842-9
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- HF-chemical etching of the oxide layer near a SiO2/Si(111) interfaceApplied Physics Letters, 1998
- GaN heteroepitaxial growth on silicon nitride buffer layers formed on Si (111) surfaces by plasma-assisted molecular beam epitaxyApplied Physics Letters, 1998
- Visible-blind GaN Schottky barrier detectors grown on Si(111)Applied Physics Letters, 1998
- Ultraviolet and violet GaN light emitting diodes on siliconApplied Physics Letters, 1998
- Nucleation of AlN on the (7×7) Reconstructed Silicon (1 1 1) SurfaceMRS Internet Journal of Nitride Semiconductor Research, 1998
- GaN growth on Si(111) substrate using oxidized AlAs as an intermediate layerApplied Physics Letters, 1997
- High quality GaN–InGaN heterostructures grown on (111) silicon substratesApplied Physics Letters, 1996
- High quality AIN and GaN epilayers grown on (00⋅1) sapphire, (100), and (111) silicon substratesApplied Physics Letters, 1995
- The growth of single crystalline GaN on a Si substrate using AIN as an intermediate layerJournal of Crystal Growth, 1993
- Growth of single crystalline GaN film on Si substrate using 3C-SiC as an intermediate layerJournal of Crystal Growth, 1991