Growth and microstructure of interfacially oriented large-crystalline-grain C60 sheets

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Abstract
C60 films reaching sheet thicknesses of ∼10 μm have been grown in vacuum by using a custom‐built effusion cell generating a beam of C60 molecules at flux rates several times higher than rates achieved by conventional methods. High quality films are grown epitaxially on Muscovite 2M1 mica substrates with double domain structures. X‐ray diffraction measurements show that in the [111] direction, the structural coherency of the films reaches ∼5000 Å. Since with increasing thickness the mosaic structures of the films do not disorder significantly, the film grains remain well oriented away from the interface.