In-situ observation of solid-liquid interface shape by X-ray radiography during silicon single crystal growth
- 30 September 1988
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 91 (4) , 509-514
- https://doi.org/10.1016/0022-0248(88)90118-2
Abstract
No abstract availableKeywords
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