Measurement of optical thickness by polarization beats interferometry
- 1 June 1992
- journal article
- Published by Elsevier in Optics Communications
- Vol. 90 (1-3) , 7-10
- https://doi.org/10.1016/0030-4018(92)90316-j
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Method to determine the phase dispersion of the third-order susceptibilityOptics Letters, 1991
- Thickness measurement of thin films by x-ray absorptionJournal of Applied Physics, 1991
- Simultaneous measurement of refractive index and thickness of thin film by polarized reflectancesApplied Optics, 1990
- Determination of optical constants of thin film from reflectance spectraApplied Optics, 1990
- Ultrafast chi /sup (3)/-related processes in semiconductor doped glassesIEEE Journal of Quantum Electronics, 1990
- Observation of femtosecond beats using Raman radiation from SiO 2 optical fibresElectronics Letters, 1990
- High resolution measurement of jet stream thickness by optical rangingOptics Communications, 1988
- Ultrahigh-frequency interference beats in transient, incoherent-light four-wave mixingOptics Letters, 1986
- Ultrafast Modulation SpectroscopyPhysical Review Letters, 1986