Irreversible island formation during deposition: separation distributions and diffraction profiles
- 20 March 1993
- journal article
- Published by Elsevier in Surface Science
- Vol. 284 (3) , L437-L443
- https://doi.org/10.1016/0039-6028(93)90490-b
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Scaling analysis of diffusion-mediated island growth in surface adsorption processesPhysical Review B, 1992
- Surface diffusion and island densityPhysical Review Letters, 1992
- Surface self-diffusion of Si on Si(001)Surface Science, 1992
- Fractal growth of two-dimensional islands: Au on Ru(0001)Physical Review Letters, 1991
- Activation energy for surface diffusion of Si on Si(001): A scanning-tunneling-microscopy studyPhysical Review Letters, 1991
- Nucleation and growth of thin filmsReports on Progress in Physics, 1984
- Diffraction from overlayer islands with positional correlationSurface Science, 1982
- A simple calculation for the average number of steps to trapping in lattice random walksJournal of Statistical Physics, 1976
- Nucleation kinetics in thin film growth. I. Computer simulation of nucleation and growth behaviourThin Solid Films, 1970
- Random Walks on Lattices. III. Calculation of First-Passage Times with Application to Exciton Trapping on Photosynthetic UnitsJournal of Mathematical Physics, 1969