An approach to quantitative high-resolution transmission electron microscopy of crystalline materials
- 31 May 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 58 (2) , 131-155
- https://doi.org/10.1016/0304-3991(94)00202-x
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
- Quantitative analysis of the deformation and chemical profiles of strained multilayersUltramicroscopy, 1994
- Quantitative high-resolution transmission electron microscopy of the incoherent Σ3 (211) boundary in CuUltramicroscopy, 1994
- Non-linear reconstruction of the exit plane wave function from periodic high-resolution electron microscopy imagesUltramicroscopy, 1994
- Determination of thickness and defocus by quantitative comparison of experimental and simulated high-resolution imagesUltramicroscopy, 1993
- Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopyPhysical Review Letters, 1992
- Resolution of oxygen atoms in staurolite by three-dimensional transmission electron microscopyNature, 1990
- Structure determination of planar defects in crystals of germanium and molybdenum by HREMActa Crystallographica Section A Foundations of Crystallography, 1988
- Electron holography approaching atomic resolutionUltramicroscopy, 1985
- Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin filmsUltramicroscopy, 1985
- Improved high resolution image processing of bright field electron micrographsUltramicroscopy, 1985