The use of metal filled via holes for improving isolation in LTCC RF and wireless multichip packages
- 1 January 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Advanced Packaging
- Vol. 23 (1) , 88-99
- https://doi.org/10.1109/6040.826766
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Manufacturing of microwave modules using low-temperature cofired ceramicsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A novel millimeter-wave IC on Si substrate using flip-chip bonding technologyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Characterization of plated via hole fences for isolation between stripline circuits in LTCC packagesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Crosstalk control for microstrip circuits on PCBs at microwave frequenciesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Experimental verification of the use of metal filled via hole fences for crosstalk control of microstrip lines in LTCC packagesIEEE Transactions on Advanced Packaging, 2001
- Development of a plastic encapsulated multichip technology for high volume, low cost commercial electronicsIEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B, 1995
- Large format fabrication-a practical approach to low cost MCM-DIEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B, 1995
- Frequency-independent equivalent circuit model for microstrip open-end and gap discontinuitiesIEEE Transactions on Microwave Theory and Techniques, 1994
- Characterization of high frequency interconnects using finite difference time domain and finite element methodsIEEE Transactions on Microwave Theory and Techniques, 1994