Error analysis of angle of incidence measurements
- 31 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 104-111
- https://doi.org/10.1016/0039-6028(69)90009-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Sources of error in ellipsometrySurface Science, 1969
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- Ionic Conductivity, Dielectric Constant, and Optical Properties of Anodic Oxide Films on Two Types of Sputtered Tantalum FilmsJournal of Applied Physics, 1966
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- An Algorithm for Least-Squares Estimation of Nonlinear ParametersJournal of the Society for Industrial and Applied Mathematics, 1963