Interface states in MNOS systems

This publication has 10 references indexed in Scilit:

• Temperature behaviour of MNOS structures
  Physics Letters A, 1977
• The determination of the energy distribution of interface traps in metal-nitride-oxide-silicon (memory) devices using non-steady-state techniques
  Solid-State Electronics, 1976
• A simplified technique for measuring fast surface states
  Solid-State Electronics, 1975
• Measurement of low densities of surface states at the SiSiO2-interface
  Solid-State Electronics, 1973
• Characterization of thin-oxide MNOS memory transistors
  IEEE Transactions on Electron Devices, 1972
• Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements
  Surface Science, 1971
• Characteristics of Fast Surface States Associated with SiO[sub 2]-Si and Si[sub 3]N[sub 4]-SiO[sub 2]-Si Structures
  Journal of the Electrochemical Society, 1969
• Surface states at steam-grown silicon-silicon dioxide interfaces
  IEEE Transactions on Electron Devices, 1966
• Ideal MOS Curves for Silicon
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• Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures
  Solid-State Electronics, 1965