Optical profilometer: a new method for high sensitivity and wide dynamic range
- 1 September 1982
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 21 (17) , 3200-3208
- https://doi.org/10.1364/ao.21.003200
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 12 references indexed in Scilit:
- Static and dynamic behavior of speckle patterns described by operator algebraApplied Optics, 1981
- Stylus profiling instrument for measuring statistical properties of smooth optical surfacesApplied Optics, 1981
- Contouring by phase conjugationApplied Optics, 1981
- Double-Beam Interferometers For Analysis Of Thin FilmsOptical Engineering, 1980
- Probability Density Functions of Speckle Intensity Produced by Weak DiffusersOptica Acta: International Journal of Optics, 1980
- Fourier optics described by operator algebraJournal of the Optical Society of America, 1980
- The wigner distribution function and its optical productionOptics Communications, 1980
- A fast versatile optical profilometerOptics Communications, 1979
- Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometerApplied Optics, 1976
- Laser beams and resonatorsProceedings of the IEEE, 1966