Connection between the Meyer-Neldel relation and multiple-trapping transport
- 15 August 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 38 (5) , 3595-3598
- https://doi.org/10.1103/physrevb.38.3595
Abstract
This paper shows that multiple-trapping-dominated transport quantities such as mobility and diffusion exhibit a Meyer-Neldel relation (MNR), an exponential relation between the prefactor of a thermally activated process and its activation energy. From these results, the Meyer-Neldel parameters can be related to the energy distribution of trapping sites and microscopic transport properties. The MNR for both the mobility of charge carriers and the annealing rate of metastable defects in hydrogenated amorphous silicon are quantitatively explained.Keywords
This publication has 22 references indexed in Scilit:
- Metastable defects in hydrogenated amorphous siliconPhysical Review B, 1987
- An investigation of the conductivity prefactor in a-Si as a function of Fermi level position using the field-effect experimentPhilosophical Magazine Part B, 1987
- The Meyer-Neldel rule in field-effect measurements and the microscopic prefactor of the conductivity in a-Si: HSolid State Communications, 1987
- Annealing of metastable defects in hydrogenated amorphous siliconPhysical Review B, 1986
- The capture cross-section and the Meyer-Neldel rule in III–V compound semiconductorsSolid State Communications, 1985
- Current transport in boeing (Cd, Zn)/CuInSe2solar cellsIEEE Transactions on Electron Devices, 1984
- Meyer–Neldel rule in solar cellsApplied Physics Letters, 1984
- The Staebler-Wronski effect and the Meyer-Neldel rule in amorphous siliconJournal of Non-Crystalline Solids, 1983
- Characterized of glow-discharge deposited a-Si:HSolar Energy Materials, 1980
- Optically induced conductivity changes in discharge-produced hydrogenated amorphous siliconJournal of Applied Physics, 1980