A radiation-hardened 16/32-bit microprocessor
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2252-2257
- https://doi.org/10.1109/23.45432
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Fabrication and total dose testing of a 256 K*1 radiation-hardened SRAMIEEE Transactions on Nuclear Science, 1988
- Single Event Upset in Combinatorial and Sequential Current Mode LogicIEEE Transactions on Nuclear Science, 1985
- Single Event Upset Immune Integrated Circuits for Project GalileoIEEE Transactions on Nuclear Science, 1985
- Single Event Upset Rate Predictions for Complex Logic SystemsIEEE Transactions on Nuclear Science, 1984