Temperature dependence of scattering in the inversion layer
- 31 August 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 98 (1-3) , 181-190
- https://doi.org/10.1016/0039-6028(80)90492-6
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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- High temperature 'variable range hopping' conductivity in silicon inversion layersJournal of Physics C: Solid State Physics, 1975
- Surfons and the Electron Mobility in Silicon Inversion LayersJapanese Journal of Applied Physics, 1974
- On the role of scattering by surface roughness in silicon inversion layersSurface Science, 1973
- Quantum Spectroscopy of the Low-Field Oscillations in the Surface ImpedancePhysical Review B, 1968