On the Repair of Redundant RAM's
- 1 March 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 6 (2) , 222-231
- https://doi.org/10.1109/tcad.1987.1270266
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- A Fault-Driven, Comprehensive Redundancy AlgorithmIEEE Design & Test of Computers, 1985
- VLSI TestingComputer, 1984
- Self-testing VLSIPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good ProductIBM Journal of Research and Development, 1980
- Circuit Implementation of Fusible Redundant Addresses on RAMs for Productivity EnhancementIBM Journal of Research and Development, 1980
- Multiple word/bit line redundancy for semiconductor memoriesIEEE Journal of Solid-State Circuits, 1978
- On a composite model to the IC yield problemIEEE Journal of Solid-State Circuits, 1975
- Applying a composite model to the IC yield problemIEEE Journal of Solid-State Circuits, 1974