Thin-film thickness and density determination from x-ray reflectivity data using a conventional power diffractometer

This publication has 8 references indexed in Scilit:

• The growth of organic thin films on silicon substrates studied by X-ray reflectometry
  Thin Solid Films, 1992
• X-ray reflectivity analysis of giant-magnetoresistance spin-valve layered structures
  Applied Physics Letters, 1992
• Quantitative X-ray analysis of interdiffusing Ta/Si multilayer structures
  Thin Solid Films, 1991
• X-ray and neutron reflectivity for the investigation of polymers
  Materials Science Reports, 1990
• Surface structure determination by X-ray diffraction
  Surface Science Reports, 1989
• Observation of X-ray interferences on thin films of amorphous silicon
  Thin Solid Films, 1973
• Surface Studies of Solids by Total Reflection of X-Rays
  Physical Review B, 1954
• Interferenz von Röntgenstrahlen an dünnen Schichten
  Annalen der Physik, 1931