A comparison of SIMS and PDMS: Analyses of mixed metal oxides
- 30 November 1988
- journal article
- Published by Elsevier in Materials Chemistry and Physics
- Vol. 20 (4-5) , 485-499
- https://doi.org/10.1016/0254-0584(88)90082-x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- 252Cf-particle desorption mass spectrometry in a depth profiling modeNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Catalytic hydrogenation activity of a ZrNi3 intermetallic alloyJournal of Vacuum Science & Technology A, 1987
- Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMSSurface and Interface Analysis, 1986
- Possible highT c superconductivity in the Ba?La?Cu?O systemZeitschrift für Physik B Condensed Matter, 1986
- Compact time-of-flight mass spectrometer using particle-induced desorptionReview of Scientific Instruments, 1986
- Static SIMS applications—From silicon single crystal oxidation to DNA sequencingJournal of Vacuum Science & Technology A, 1985
- Californium-252 plasma desorption mass spectrometryAnalytical Chemistry, 1983
- Characterization of solids and surfaces using ion beams and mass spectrometryProgress in Solid State Chemistry, 1981
- Field ion and field desorption mass spectrometry of inorganic compoundsSurface Science, 1978