A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in the laboratory
- 14 March 2002
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 485 (1-2) , 183-187
- https://doi.org/10.1016/s0168-9002(02)00552-1
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Single event latchup threshold estimation based on laser dose rate test resultsIEEE Transactions on Nuclear Science, 1997
- Laboratory tests for single-event effectsIEEE Transactions on Nuclear Science, 1996
- Critical evaluation of the pulsed laser method for single event effects testing and fundamental studiesIEEE Transactions on Nuclear Science, 1994