Identification of stress-induced leakage current components and the corresponding trap models in SiO/sub 2/ films
- 1 June 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 44 (6) , 986-992
- https://doi.org/10.1109/16.585555
Abstract
No abstract availableKeywords
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