Heavy ion sensitivity of a SRAM in SOI bulk-like technology

Publisher Website

30 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/radecs.1993.316518

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

SEU in SOI SRAMs-a static model
IEEE Transactions on Nuclear Science, 1994
A simple estimate of funneling-assisted charge collection
IEEE Transactions on Nuclear Science, 1991
Single-event charge enhancement in SOI devices
IEEE Electron Device Letters, 1990