Ultimate CMOS ULSI performance

Publisher Website

30 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1993.347386

Abstract

No abstract available

Keywords

This publication has 5 references indexed in Scilit:

Ultimate CMOS density limits: measured source drain resistance in ultra small devices
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Physics and technology of ultra short channel MOSFET devices
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
Low-voltage ULSI design
IEEE Journal of Solid-State Circuits, 1993
Trading speed for low power by choice of supply and threshold voltages
IEEE Journal of Solid-State Circuits, 1993
Design of ion-implanted MOSFET's with very small physical dimensions
IEEE Journal of Solid-State Circuits, 1974