New Methods of Measuring Capacitance and Resistance of Very High Loss Materials at High Frequencies
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 29 (1) , 28-36
- https://doi.org/10.1109/tim.1980.4314857
Abstract
Two new circuits for the accurate measurement of specimen capacitance and resistive loss are described. The capacitance measurements are unaffected by the specimen resistance when the parallel resistance is greater than 30 Ω. The practicality of the circuit is enhanced by its use of coaxial cable to provide both connection to the sample and the inductance required for circuit operation. An important characteristic of the circuit is its ability to measure capacitance and resistance of very high loss specimens accurately.Keywords
This publication has 3 references indexed in Scilit:
- A Differential Capacitor Circuit for Very High and Low Dielectric Q-Factor Measurement at High FrequenciesIEEE Transactions on Instrumentation and Measurement, 1973
- A New Method of Measuring Dielectric Property of Very-High-Loss Materials at High FrequenciesIEEE Transactions on Instrumentation and Measurement, 1970
- On the New Method of Measuring Dielectric Constant and Loss Angles of SemiconductorsJournal of Applied Physics, 1953