The testability-preserving concurrent decomposition and factorization of Boolean expressions
- 1 June 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 11 (6) , 778-793
- https://doi.org/10.1109/43.137523
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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