Combined ac photocurrent and photothermal reflectance measurements in semiconducting p-n junctions. II
- 1 December 1989
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 66 (11) , 5584-5593
- https://doi.org/10.1063/1.344463
Abstract
The ac photocurrent (PC) and photothermal reflectance (PTR) spectroscopic response theory of a semiconducting p‐n junction developed in part I [J. Appl. Phys. 6 6, ⧠⧠⧠⧠ (1989)] is applied to theoretical simulations to identify the influence of the various electronic and geometrical device parameters involved. The theory is further tested in an experimental configuration with a commercial solar cell. The experimental ac photocurrent and photothermal reflectance data exhibited satisfactory agreement with the theoretical model, and yielded, respectively, experimental values for the minority lifetimes τp and τn. A combination of PC and PTR data yielded reasonable Ln estimates.This publication has 10 references indexed in Scilit:
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