Adhesion Maps Using Scanning Force Microscopy Techniques
- 1 December 1999
- journal article
- research article
- Published by Taylor & Francis in The Journal of Adhesion
- Vol. 71 (4) , 339-356
- https://doi.org/10.1080/00218469908014547
Abstract
A technique has been developed that allows a real-time measurement of the lift-off force required to remove a scanning force microscope tip from a substrate. Both topography and adhesion maps are obtained simultaneously, allowing the correlation between topography and adhesion properties to be studied. Quantitative values of important adhesion parameters can be extracted from these data. A number of examples are given which illustrate the utility of this technique.Keywords
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