The Interaction between Micrometer-size Particles and Flat Substrates: A Quantitative Study of Jump-to-Contact
- 1 May 1998
- journal article
- research article
- Published by Taylor & Francis in The Journal of Adhesion
- Vol. 67 (1-4) , 291-305
- https://doi.org/10.1080/00218469808011113
Abstract
The interaction force acting on an individual micrometer-size polystyrene particle near a flat, electrically conducting substrate has been measured by attaching the particle to an atomic force microscope cantilever. From the spatial dependence of the interaction force, the equations of motion governing a particle near the substrate can be determined. These considerations allow a prediction of the jump-to-contact distance of the particle as it approaches the substrate. This distance is measured as a function of particle radius and compared with predictions based on the relevant interaction force models.Keywords
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