High performance InAs/Ga1-xInxSb superlattice infrared photodiodes
- 1 December 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (22) , 3251-3253
- https://doi.org/10.1063/1.120551
Abstract
The optical and electrical properties of infrared photodiodesdiodes based on InAs/(GaIn)Sb superlatticesgrown by molecular beam epitaxy were investigated. The diodes, with a cut-off wavelength around 8 μ m show a current responsivity of 2 A/W. By proper adjustment of the p-doping level above the n-background concentration the depletion width exceeds a critical size of about 60 nm, leading to the suppression of band-to-band tunnelingcurrents. Above that critical width the dynamic impedance R 0 A at 77 K reaches values above 1 k Ω cm 2 leading to a Johnson-noise-limited detectivity in excess of 1×10 12 cm √ Hz/W.Keywords
This publication has 9 references indexed in Scilit:
- Electrical and optical properties of infrared photodiodes using the InAs/Ga1−xInxSb superlattice in heterojunctions with GaSbJournal of Applied Physics, 1996
- Effect of interfacial bonding on the structural and vibrational properties of InAs/GaSb superlatticesPhysical Review B, 1996
- Optimization of absorption in InAs/InxGa1-xSb superlattices for long-wavelength infrared detectionSuperlattices and Microstructures, 1995
- Optical and structural investigations of intermixing reactions at the interfaces of InAs/AlSb and InAs/GaSb quantum wells grown by molecular-beam epitaxyJournal of Crystal Growth, 1995
- Reply to ‘‘Comment on ‘Temperature limits on infrared detectivities of InAs/InxGa1−xSb superlattices and bulk Hg1−xCdxTe’ ’’ [J. Appl. Phys. 74, 4774 (1993)]Journal of Applied Physics, 1995
- Midwave infrared stimulated emission from a GaInSb/InAs superlatticeApplied Physics Letters, 1995
- Auger lifetime enhancement in InAs–Ga1−xInxSb superlatticesApplied Physics Letters, 1994
- Proposal for strained type II superlattice infrared detectorsJournal of Applied Physics, 1987
- Tunnel contribution to Hg1−xCdxTe and Pb1−xSnxTe p−n junction diode characteristicsInfrared Physics, 1980