X-ray sensitivity of a charge-coupled-device array
- 1 June 1977
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 48 (6) , 2565-2569
- https://doi.org/10.1063/1.323974
Abstract
The quantitative response of a charge‐coupled device(CCD) to x rays in the 5–14‐keV range was measured and computed. Comparison of experimental and theoretical quantum efficiencies provides a method to determine electron diffusion lengths in these devices. Compared to a common x‐ray film, the CCDamplifier combination tested in this work has a similar threshold and significantly smaller range of response. The CCD offers somewhat poorer spatial resolution than the x‐ray film. Comparisons of the CCD with other active x‐ray detectors are also presented.This publication has 6 references indexed in Scilit:
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