Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions
- 1 December 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 47 (6) , 2580-2585
- https://doi.org/10.1109/23.903812
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effectsIEEE Transactions on Nuclear Science, 1998
- SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domainIEEE Transactions on Nuclear Science, 1998
- A new approach for the prediction of the neutron-induced SEU rateIEEE Transactions on Nuclear Science, 1998
- In-flight and ground testing of single event upset sensitivity in static RAMsIEEE Transactions on Nuclear Science, 1998
- Single event upset at ground levelIEEE Transactions on Nuclear Science, 1996
- Neutron-induced single event upsets in static RAMS observed a 10 km flight attitudeIEEE Transactions on Nuclear Science, 1993
- Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsetsIEEE Transactions on Nuclear Science, 1989
- Effect of Cosmic Rays on Computer MemoriesScience, 1979
- MONTE CARLO CALCULATIONS ON INTRANUCLEAR CASCADES (thesis)Published by Office of Scientific and Technical Information (OSTI) ,1963
- Nuclear Reactions at High EnergiesPhysical Review B, 1947