An estimate of error rates in integrated circuits at aircraft altitudes and at sea level

This publication has 13 references indexed in Scilit:

• Microelectronics and microdosimetry
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
• Microdosimetry: Measured Probabilities for Energy Deposited by Mesons in One-Micron Sites in Silicon
  IEEE Transactions on Nuclear Science, 1986
• Meson Interactions in NMOS and CMOS Static RAMs
  IEEE Transactions on Nuclear Science, 1985
• Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data
  IEEE Transactions on Nuclear Science, 1984
• A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984
  IEEE Transactions on Nuclear Science, 1984
• The Relative Efficiency of Soft-Error Induction in 4K Static RAMS by Muons and Pions
  IEEE Transactions on Nuclear Science, 1983
• Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
  IEEE Transactions on Nuclear Science, 1983
• Single Event Upsets in RAMs Induced by Protons at 4.2 GeV and Protons and Neutrons below 100 MeV
  IEEE Transactions on Nuclear Science, 1980
• Low-EnergyπMesons in the Cosmic Radiation
  Physical Review B, 1960
• Cosmic-Ray Neutron Energy Spectrum
  Physical Review B, 1959